Dynamic fault generator for simulating gracefully degradable components
[Examensarbete på avancerad nivå]
Transistors dimensions are scaling down according to Moore’s Law making integrated circuits much prone to failures. To help study the reliability of such complex systems, the aim of this thesis is to develop a high-level tool that inject faults dynamically on a gracefully degradable adaptive system during its lifetime. Our developed tool operates in closed-loop with the rest of the experimental setup, receiving feedback parameters that have an influence on the prediction routine, such as the components’ utilization rates. Additionally, the tool is able to consider transistor wearout effects in the fault prediction routine, such as Negative Bias Temperature Instability (NBTI).
Furthermore, we were able to examine different degradable aspects of complex systems using different fault scen
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